36 results
Latency Dose Formation In DMC By Inelastic Electron Scattering
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2216-2217
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Coherence and Inelastic Scattering in Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2762-2763
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Juvenile sexual delinquents
-
- Journal:
- European Psychiatry / Volume 13 / Issue S4 / 1998
- Published online by Cambridge University Press:
- 16 April 2020, p. 202S
-
- Article
-
- You have access
- Export citation
Low Dose-Rate High-Resolution Transmission Electron Microscopy of Group III – Nitride Electronic Device Structures Using a Direct Electron Detector
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1714-1715
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited
-
- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 176
-
- Article
- Export citation
Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1321-1322
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Atomic Resolution Characterization of Ni base Nanoparticles for Energy Devices.
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1138-1139
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
CIGS Nanoparticles Observed in TEM Low Dose Condition. Atomic Resolution and Beam Effects
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 238-239
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Probing the Onset of Functional Behavior by Exciting Reversible Atom Displacements Using Variable Voltages and Dose Rates
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1210-1211
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Microstructural Effects on the Shock Compression Response of Cold-Rolled Ni/Al Multilayers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1521 / 2013
- Published online by Cambridge University Press:
- 01 February 2013, mrsf12-1521-oo08-03
- Print publication:
- 2013
-
- Article
- Export citation
Low Dose Imaging of Quantum Wells in the System CdSe-ZnSe
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1856-1857
- Print publication:
- July 2012
-
- Article
- Export citation
In situ measurement of growth stress in alumina scale
-
- Journal:
- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 69-73
-
- Article
- Export citation
Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1064-1065
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 130-131
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 122-123
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Retardation, Surface and Interface Effects in VEELS
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1250-1251
- Print publication:
- August 2007
-
- Article
- Export citation
Spinodal Decomposition in Thick InGaN Layers Studied by Strain Field Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1014-1015
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Rapid structural and chemical characterization of ternary phase diagrams using synchrotron radiation
-
- Journal:
- Journal of Materials Research / Volume 18 / Issue 10 / October 2003
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2522-2527
- Print publication:
- October 2003
-
- Article
- Export citation
The effect of residual lens aberrations on the determination of column positions around partial dislocations in GaAs
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 498-499
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation
Comparative Study of Thickness Dependence of Critical Current Density of Yba2Cu3O7–δ on (100) SrTiO3 and on Rolling-assisted Biaxially Textured Substrates
-
- Journal:
- Journal of Materials Research / Volume 17 / Issue 7 / July 2002
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1750-1757
- Print publication:
- July 2002
-
- Article
- Export citation